0. 7-1. 4 < Ω. cm> Resistivity≤6E+17 < at/cm³> Oxygen Content≤5E+16 <at/cm³> Carbon Content (91视频网站在线观看)≥1000 <μs> Minority Carrier Lifetime 1牛 - Materials Performance "www91" Item Specification (www91) Inspection Method Growth Mode CZ --Crystallinity Monocrystalline --Geometric dimensions G10-L：182. 2*183. 75*φ256mm M11-L：182. 2*191. 6*φ262. 5 Wafer inspection systemThickness 130±8μm Wafer inspection system Item: Growth Mode Specification: CZ Inspection Method: --Item: Crystallinity Specification: Monocrystalline Inspection Method: --Item: Geometric dimensions Specification: G10-L：182. 2*183 91视频播放 . 75*φ256mm M11-L：182. 2*191. 6*φ262. 5 Inspection Method: Wafer inspection systemItem: Thickness Specification: 130±8μm Inspection Method: Wafer inspection systemElectrical Property Item (91视频网站在线观看) Specification Inspection Method Resistivity 0. 7-1. 4 Ω. cm Wafer inspection systemMinority Carrier Lifetime ≥1000/μs Transient with injection level: 5E14 cm-3（Sinton BCT-400 ）Oxygen Content ≤6E+17 at/cm³ FTIR spectrometerCarbon Content ≤5E+16 at/cm³ FTIR spectrometer Item: Resistivity Specification: 0. 7-1. 4 Ω. cm Inspection Method: Wafer inspection systemItem: Minority Carrier Lifetime Specification: ≥1000/μs Inspection Method: Transient with injection level: 5E14 cm-3（Sinton BCT-400 ）Item: Oxygen Content Specification: ≤6E+17 at/cm³ Inspection Method: FTIR spectrometerItem: Carbon Content Specification: ≤5E+16 at/cm³ Inspection Method: FTIR spectrometer Contact Us (91牛) LONGi offers professional consulting services, N-type silicon wafer production expertise, technical knowledge of PV power plants, and full life-cycle O&M capabilities.Consult now
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